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HXRF-450S XRF Coating Thickness Tester with SDD Detector

Bescheinigung
CHINA HUATEC  GROUP  CORPORATION zertifizierungen
CHINA HUATEC  GROUP  CORPORATION zertifizierungen
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HXRF-450S XRF Coating Thickness Tester with SDD Detector

HXRF-450S XRF Coating Thickness Tester with SDD Detector
HXRF-450S XRF Coating Thickness Tester with SDD Detector HXRF-450S XRF Coating Thickness Tester with SDD Detector

Großes Bild :  HXRF-450S XRF Coating Thickness Tester with SDD Detector

Produktdetails:
Herkunftsort: China
Markenname: HUATEC
Zertifizierung: CE
Modellnummer: HXRF-450S
Zahlung und Versand AGB:
Min Bestellmenge: 1 ST
Preis: USD14145/set - USD15990/set
Verpackung Informationen: Karton -Packbox
Lieferzeit: 10-15 Werktage nach Eingang Ihrer Zahlung
Zahlungsbedingungen: T/T, Paypal
Versorgungsmaterial-Fähigkeit: 5sets/month

HXRF-450S XRF Coating Thickness Tester with SDD Detector

Beschreibung
Messbereich:: Aluminium (Al) - Uran (U) Detektor: SDD
Test time: 10-40s Röhrenstrom: 0-1mA (programmbestimmt)
Hochdruck: 0-50 kV (programmgesteuert) Vergrößerung: Optik: 40-60 ×
Eingangsspannung:: AC220V ± 10% 50/60HZ
Hervorheben:

XRF coating thickness tester

,

X-ray fluorescence paint tester

,

non-destructive coating thickness analyzer

HXRF-450S XRF X-ray Fluorescence Coating Painting Thickness Tester
Product Specifications
Attribute Value
Measurement element range Aluminum (Al) - uranium (U)
Detector SDD
Test time 10-40s
Tube current 0-1mA (Program-controlled)
High pressure 0-50kV (Program-controlled)
Magnification Optics: 40-60×
Input voltage AC220V±10% 50/60HZ
Product Overview

The HXRF-450S XRF X-ray Fluorescence Coating Painting Thickness Tester is a high-performance instrument designed for precise coating thickness measurement and material analysis across various industries.

Working Conditions
  • Operating temperature: 15-30℃
  • Relative humidity: 40%~50%
  • Power supply: AC: 220V ± 5V
Technical Performance
  • Excellent long-term stability with minimal calibration requirements
  • No sample preparation needed for coating systems, solid or liquid samples
  • Comprehensive performance including coating analysis, qualitative/quantitative analysis, bath analysis, and statistical functions
Applications

Ideal for electronic components, semiconductors, PCB, FPC, LED brackets, auto parts, functional plating, decorative parts, connectors, terminals, sanitary ware, jewelry and other industries for surface coating thickness measurement and material analysis.

Safety Features
  • Simple user interface with limited operator authorization
  • Supervisor maintenance capabilities
  • Automatic operator usage records
  • Automatic locking for unauthorized operation prevention
  • Sample chamber door sensor
  • X-ray warning light
  • Front panel security buttons
Key Features
  • Measures up to 5 layers (4 coating + substrate) simultaneously
  • Analyzes 15 elements with automatic spectral line correction
  • High measurement accuracy (to μin) with excellent stability
  • Rapid non-destructive measurement (as fast as 10s)
  • Analyzes solids and solutions with qualitative, semi-quantitative and quantitative capabilities
  • Material identification and classification detection
  • Comprehensive data statistics (average, standard deviation, etc.)
  • Multiple output options (print, PDF, Excel) with comprehensive reporting
  • Measurement position preview with 30× optical magnification
  • Global service and technical support
Technical Parameters
Parameter Specification
Measurement element range Aluminum (Al) - uranium (U)
Detector SDD
Collimator types Fixed single hole (0.15mm, 0.2mm, 0.5mm)
Optical path system Vertical irradiation
Magnification Optics: 40-60×
Display modes Elemental spectrum, label pattern, elements and measurement values
Camera High-definition industrial camera with local magnification
Applications Single/double coating, alloy coating, electroplating solution
Input voltage AC220V±10% 50/60HZ
Communication High-speed USB transmission
Dimensions 555*573*573mm (410*478*245mm cavity)
X-ray source High-precision micro-focusing light tube (W Target)
Software features FP algorithm, automatic fault diagnosis/correction, automatic compensation
Standard Configuration
SDD Semiconductor Detector
  • Electrically cooled SDD semiconductor detector
  • Resolution: 129 ± 5 EV
  • Amplification circuit module for sample characteristic X-ray detection
X-ray Excitation Device
  • Maximum filament current output: 1mA
  • Semi-loss component, 50W, air cooling
High-pressure Transmitter
  • Maximum voltage output: 50kV
  • Minimum 5kV controllable adjustment
  • Self-contained voltage overload protection
HXRF-450S XRF Coating Thickness Tester with SDD Detector 0 HXRF-450S XRF Coating Thickness Tester with SDD Detector 1

Kontaktdaten
HUATEC GROUP CORPORATION

Ansprechpartner: Ms. Shifen Yuan

Telefon: 8610 82921131,8613910983110

Faxen: 86-10-82916893

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